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In: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), IEEE

Linear Classification of Badly Conditioned Data

Helene Dörksen und Volker Lohweg,
Sep 2018
Literatur Beschaffung: 23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), IEEE
@inproceedings{710,
author= {Dörksen, Helene and Lohweg, Volker},
title= {Linear Classification of Badly Conditioned Data},
booktitle= {23rd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)},
year= {2018},
editor= {},
volume= {},
series= {},
pages= {},
address= {Italien},
month= {Sep},
organisation= {},
publisher= {IEEE},
note= {},
}